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Scanning Probe Microscope

bob体育中心 System Specs.

Product
No.
Temperature Option TERS
Option
LHe
Hold
Optical
Access
Far Field
Lens
AFM In situ
Deposition
Magnetic
Field
Temperature
Variable
High
Frequency
1Ghz
USM1200LL
LT bob体育中心
300 K,
80 K,
Option:
50–5 K
× TBD 300 h
USM1400LL
LT bob体育中心
300 K,
80–5 K,
Option:
5–3 K
× 40 h
USM1400TL
LT bob体育中心
300 K,
80–5 K,
5–3 K
TBD
0.5 T
40 h
USM1500
LT bob体育中心
100–2 K × × 8 T
(Standard)
× 4–8 Day
USM1300
VLT STM
80 K–350 mK × × 11 T,
15 T,
2-2-9 T,
Other
TBD × 5–8 Day
USM1300J
VLT STM
80 K–350 mK × × 11 T,
15 T,
2-2-9 T,
Other
× 4–8 Day
USM1600
ULT STM
80 K,
5 K–40 mK
× × 11 T,
15 T,
2-2-9 T,
Other
TBD × × 5–8 Day
USM1600J
ULT STM
5 K–40 mK × × 11 T,
15 T,
2-2-9 T,
Other
TBD × 4–6 Day

  • bob体育中心 : Scanning Probe Microscope
  • STM: Scanning Tunneling Microscope
  • LT: Low Temperature
  • VLT: Very Low Temperature
  • ULT: Ultra Low Temperature